A national workshop organized Indian Institute of Metals

New Horizons in Metallurgy, Materials, and Manufacturing

A national workshop organized by Indian Institute of Metals
December 14th - 16th 2020

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Correlative electron microscopy and atom probe tomography (EM/APT): Experimental techniques and its applications

avatar Prof. Surendra Kumar Makineni Department of Materials Engineering
IISc Bangalore
  • Bio

    Surendra Kumar Makineni is an assistant professor in the Department of Materials Engineering, IISc Bangalore since 2020. He did his doctoral thesis work on high-temperature alloys from the same department in 2016. He moved as a post-doctoral researcher at the University of Michigan for one year and later as a Humboldt fellow in Max-Planck-Institute for Iron Research, Düsseldorf. His group primarily works on various materials for engineering applications such as aerospace, automobiles, etc. They manipulate structures at the atomic-scale by elemental additions to design new materials with improved properties. The main areas are Superalloys (Co- and Ni-based), Light Metal Alloys (Al- and Mg-based), and other engineering alloys such as Cu-based, High entropy alloys, etc. Additionally, with advanced microscopy characterization methods, they correlate the effect of local structure and compositional changes directly to the material strength and creep properties.

  • Abstract

    Correlative experimental techniques using electron microscopy (EM) and atom probe tomography (APT) from the same region of interest on the sample led to determine both the structural and three dimensional compositional information at atomic scale. These techniques are advantageous when the microstructure is inhomogeneous and/or when targeting rare features that can influence overall material properties. Complementary use of both EM and APT enabled to overcome their associated individual drawbacks that are related to their mass and spatial resolution respectively. EM techniques such as orientation mapping, electron diffraction and imaging, high resolution Z-contrast imaging in scanning transmission EMs can provide local crystallographic/structural information while APT provide high mass resolution with high element sensitivity in the range of 10 part-per-million.

    In this talk, I will introduce the experimental methods and protocols for sample preparation for successfully performing EM/APT correlative studies. This will be followed by examples with their application to different alloy systems.